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Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Series: Publication details: Bellingham, Wash. : SPIE ; Springfield, Va. : IS&T, c2005.Description: viii, 302 p : ill ; 28 cmISBN:- 0819456527
| Item type | Home library | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|
| Long loan | Pilkington Library Pilkington Main Collection | 621.36/MAC (Browse shelf(Opens below)) | Available | 0403342120 |
Total holds: 0
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| 621.36/KRE Digital diffractive optics : an introduction to planar diffractive optics and related technology / | 621.36/LEE Electromagnetic principles of integrated optics / | 621.36/LIF Integrated photonics : | 621.36/MAC Machine vision applications in industrial inspection XIII : | 621.36/MAR Integrated optics : | 621.36/MEN Photonics : | 621.36/MIC Microwave photonics : |
At head of title page "Proceedings of Electronic Imaging, Science and Technology"
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