Machine vision applications in industrial inspection XIII :

Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering. - Bellingham, Wash. : Springfield, Va. : SPIE ; IS&T, c2005. - viii, 302 p : ill ; 28 cm. - SPIE proceedings series, v. 5679 .

At head of title page "Proceedings of Electronic Imaging, Science and Technology"

0819456527


Engineering inspection--Automation--Congresses
Computer vision--Industrial applications--Congresses
Quality control--Automation--Congresses
Mensuration--Congresses