Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA / Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.

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Series: Publication details: Bellingham, Wash. : SPIE ; Springfield, Va. : IS&T, c2005.Description: viii, 302 p : ill ; 28 cmISBN:

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Holdings
Item type	Home library	Call number	Status	Date due	Barcode	Item holds
Long loan	Pilkington Library Pilkington Main Collection	621.36/MAC (Browse shelf(Opens below))	Available		0403342120

Total holds: 0

At head of title page "Proceedings of Electronic Imaging, Science and Technology"

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