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Economics of electronic design, manufacture and test / edited by Magdy Abadir, Tony Ambler. by Series: Frontiers in electronic testing
Publication details: Boston ; London : Kluwer Academic, c1994
Availability: Items available for loan: Pilkington Library (1)Call number: 658.15967/ECO.
Reasoning in Boolean networks : logic synthesis and verification using testing techniques / by Wolfgang Kunz and Dominik Stoffel. by Series: Frontiers in electronic testing
Publication details: Boston : Kluwer Academic Publishers, c1997
Availability: Items available for loan: Pilkington Library (1)Call number: 511.32/KUN.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal. by Series: Frontiers in electronic testing
Publication details: Boston, Mass. ; London : Kluwer Academic, c2000
Availability: Items available for loan: Pilkington Library (1)Call number: 621.381/BUS.
Design for at-speed test, diagnosis and measurement / edited by Benoit Nadeau-Dostie. by Series: Frontiers in electronic testing
Publication details: Boston, Mass. ; London : Kluwer Academic, c2000
Availability: Items available for loan: Pilkington Library (1)Call number: 621.38173/DES.
A designer's guide to built-in self-test / Charles E. Stroud. by Series: Frontiers in electronic testing
Publication details: Boston : Kluwer Academic, 2002
Availability: Items available for loan: Pilkington Library (1)Call number: 621.38173/STR.
Research perspectives and case studies in system test and diagnosis / by John W. Sheppard and William R. Simpson. by Series: Frontiers in electronic testing
Publication details: Boston ; London : Kluwer Academic, 1998
Availability: Items available for loan: Pilkington Library (1)Call number: 620.0044/SHE.
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