Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
Series: Frontiers in electronic testingPublication details: Boston, Mass. ; London : Kluwer Academic, c2000Description: xviii, 690 p. : ill. ; 26 cmISBN:- 0792379918
- 621.395 21
Item type | Home library | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|
Long loan | Pilkington Library Pilkington Main Collection | 621.381/BUS (Browse shelf(Opens below)) | Available | 0402335759 |
Total holds: 0
Includes bibliographical references and index
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