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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.

By: Contributor(s): Series: Frontiers in electronic testingPublication details: Boston, Mass. ; London : Kluwer Academic, c2000Description: xviii, 690 p. : ill. ; 26 cmISBN:
  • 0792379918
Subject(s): DDC classification:
  • 621.395 21
Holdings
Item type Home library Call number Status Date due Barcode Item holds
Long loan Pilkington Library Pilkington Main Collection 621.381/BUS (Browse shelf(Opens below)) Available 0402335759
Total holds: 0

Includes bibliographical references and index

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