Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.].

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Series: Publication details: Bellingham, Washington : SPIE, c2002.Description: vii, 186 p. : ill. ; 28 cmISBN:

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Holdings
Item type	Home library	Call number	Status	Date due	Barcode	Item holds
Long loan	Pilkington Library Pilkington Main Collection	620.0044/SUR (Browse shelf(Opens below))	Available		0402821319

Total holds: 0

Includes bibliographic references and author index

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