Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Bushnell, Michael L.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal. - Boston, Mass. ; London : Kluwer Academic, c2000 - xviii, 690 p. : ill. ; 26 cm. - Frontiers in electronic testing .
Includes bibliographical references and index
0792379918
00046212
bA104514
Integrated circuits--Very large scale integration--Testing
Digital integrated circuits--Testing
Mixed signal circuits--Testing
Semiconductor storage devices--Testing
621.395
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal. - Boston, Mass. ; London : Kluwer Academic, c2000 - xviii, 690 p. : ill. ; 26 cm. - Frontiers in electronic testing .
Includes bibliographical references and index
0792379918
00046212
bA104514
Integrated circuits--Very large scale integration--Testing
Digital integrated circuits--Testing
Mixed signal circuits--Testing
Semiconductor storage devices--Testing
621.395