Hot-carrier effects in MOS devices / Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada.

By:

Contributor(s):

Publication details: San Diego ; London : Academic Press, c1995Description: xii,312p : ill ; 24cmISBN:

Subject(s):

DDC classification:

Holdings
Item type	Home library	Call number	Status	Date due	Barcode	Item holds
Long loan	Pilkington Library Pilkington Main Collection	621.38171/TAK (Browse shelf(Opens below))	Available		0401991121

Total holds: 0

There are no comments on this title.

to post a comment.