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Laser-induced damage in optical materials, 1990 [electronic resource] / Harold E. Bennett, Lloyd L. Chase, Arthur H. Guenther, Brian E. Newnam, M. J. Soileau, editors, Sponsors, American Society for Testing Materials, Center for Research in Electro-Optics and Lasers at the University of Central Florida, Lawrence Livermore National Laboratory, Los Alamos National Laboratory National Institute of Standards and Technology, SPIE--The International Society for Optical Engineering, Weapons Laboratory (USAF). by Series: Proceedings of SPIE--the International Society for Optical Engineering ; STP 1441. | Journal of ASTM International ; STP 1141.
Publication details: Boulder, Colo. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1991
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Availability: Items available for loan: Online Resource (1).
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