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		SICE-ICCAS 2006 [electronic resource] : SICE-ICASE International Joint Conference 2006, October 18-21, 2006, BEXCO (Busan Exhibition & Convention Center), Busan, Korea. by SICE-ICASE International Joint Conference (2006 : Pusan, Korea) Keisoku Jido Seigyo Gakkai (Japan) Institute of Control, Automation, and System Engineers (Korea) IEEE Xplore (Online service) Publication details: Bucheon-City, Korea : ICASE, c2006 Other title: SICE-ICASE, 2006, International Joint Conference. SICE-ICASE International Joint Conference 2006 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		IMTC/2007 [electronic resource] : 2007 IEEE Instrumentation and Measurement Technology Conference proceedings : synergy of science and technology in instrumentation and measurement : Warsaw Marriott Hotel, Warsaw, Poland, May 1-3, 2007 / IEEE, IEEE Instrumentation and Measurement Society. by IEEE Instrumentation and Measurement Technology Conference (24th : 2007 : Warsaw, Poland) Institute of Electrical and Electronics Engineers IEEE Instrumentation and Measurement Society IEEE Xplore (Online service) Publication details: Piscataway, NJ : IEEE, c2007 Other title: 2007 IEEE Instrumentation and Measurement Technology Conference Synergy of science and technology in instrumentation and measurement Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on [electronic resource]. by International Conference on Electronic Measurement and Instruments (8th : 2007: : Xi'an Shi, China) IEEE Xplore (Online service) Publication details: [Piscataway, NJ : IEEE, 2007] Other title: ICEMI '07 ICEMI 2007 Eighth International Conference on Electronic Measurement and Instruments Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on : [electronic resource] : 6-10 Nov. 2006. by IEEE Industrial Electronics Society. Conference (32nd : 2006 : Paris, France) IEEE Industrial Electronics Society IEEE Xplore (Online service) Publication details: [Piscataway, N.J. : IEEE Xplore, 2006 Other title: IECON 2006 IEEE IECON 2006 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available SICE Annual Conference 2007 in Takamatsu [electronic resource] : final program and abstracts, Kagawa University, Takamatsu, Japan, September 17-20, 2007 / organized by the Society of Instrument and Control Engineers (SICE) ; supported by Kagawa University ... [et al.] ; technically co-sponsored by IEEE Industrial Electronics Society (IEEE/IES) ... [et al.] ; in cooperation with Institute of Control, Robotics and Systems, Korea (ICROS) ... [et al.]. by Keisoku Jido Seigyo Gakkai (Japan). Gakujutsu Koenkai (2007 : Kagawa University) Keisoku Jido Seigyo Gakkai (Japan) Kagawa Daigaku IEEE Industrial Electronics Society Institute of Electrical and Electronics Engineers Publication details: [Tokyo, Japan : Piscataway, NJ : Society of Instrument and Control Engineers ; IEEE, 2007?] Other title: SICE, 2007, Annual Conference Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available The 33rd Annual Conference of the IEEE Industrial Electronics Society (IECON) [electronic resource] : Nov. 5-8, 2007, the Grand Hotel, Taipei, Taiwan / sponsored by IEEE Industrial Electronics Society ; technically co-sponsored by National Chung Cheng University ... [et al.] ; organized by National Chung Cheng University, National Taiwan University. by IEEE Industrial Electronics Society. Conference (33rd : 2007 : Taipei, Taiwan) IEEE Industrial Electronics Society Guo li Zhongzheng da xue (Taiwan) Guo li Taiwan da xue IEEE Xplore (Online service) Publication details: Piscataway, NJ : IEEE, c2007 Online resources: Access restricted to subscribers Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available 2008 IEEE International Instrumentation and Measurement Technology Conference proceedings [electronic resource] : 12-15 May 2008 Fairmont Empress Hotel & Victoria Conference Center, Victoria, British Columbia, Canada / IEEE, I&M IEEE Instrumentation & Measurement Society. by IEEE International Instrumentation and Measurement Technology Conference (25th : 2008 : Victoria, B.C.) Institute of Electrical and Electronics Engineers IEEE Instrumentation and Measurement Society Publication details: Piscataway, NJ : IEEE, c2008 Other title: Ip2sMTC International Instrumentation and Measurement Technology Conference proceedings Online resources: Access restricted to subscribers Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available SICE Annual Conference 2008 [electronic resource] : international conference on instrumentation, control, and informational technology : final program and papers : Aug. 20 (Wed.)-22 (Fri.) : the University of Electro-Communications (UEC), Chofu, Tokyo, Japan / organized by the Society of Instrument and Control Engineers (SICE) ; supported by Chofu City, the Univ. of Electro-Communications ; technically co-sponsored by IEEE/IES ... [et al.] ; in association with China Instrument and Control Society (CIS) ... [et al.]. by Keisoku Jido Seigyo Gakkai (Japan). Gakujutsu Koenkai (2008 : University of Electro-Communications) Keisoku Jido Seigyo Gakkai (Japan) Denki Tsushin Daigaku IEEE Industrial Electronics Society Zhongguo yi qi yi biao xue hui Publication details: Tokyo, Japan : Society of Instrument and Control Engineers, 2008 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		No cover image available ICCAS-SICE 2009 [electronic resource] : ICROS-SICE International Joint Conference 2009 : http://www.sice.or.jp/ICCAS-SICE2009/ : Fukuoka International Congress Center ... August 18-21, 2009 : proceedings / organized by the Society of Instrument and Control Engineers (SICE) [and] the Institute of Control, Robotics and Systems (ICROS) ; supported by Fukuoka City ; technically co-sponsored by IEEE Industrial Electronics Society ... [et al.] ; in association with Asian Control Association (ACA) ... [et al.]. by ICROS-SICE International Joint Conference (2009 : Fukuoka-shi, Japan) Keisoku Jido Seigyo Gakkai (Japan). Gakujutsu Koenkai (2009 : Fukuoka-shi, Japan) Keisoku Jido Seigyo Gakkai (Japan) Institute of Control, Robotics, and Systems IEEE Industrial Electronics Society Asian Control Association International Conference on Control, Automation, and Systems (2009 : Fukuoka-shi, Japan) Publication details: Tokyo, Japan : Society of Instrument and Control Engineers, 2009 Other title: ICROS-SICE International Joint Conference 2009 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		Capacitive sensors [electronic resource] : design and applications / Larry K. Baxter. by Baxter, Larry K IEEE Industrial Electronics Society Series: IEEE Press series on electronics technology Publication details: New York : IEEE Press, c1997 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		Introduction to instrumentation and measurements / Robert B. Northrop. by Northrop, Robert B [author.] Edition: Third edition. Publisher: Boca Raton : CRC Press, Taylor & Francis Group, [2017]Copyright date: ©2014 Other title: Instrumentation and measurements Availability: Items available for loan: Pilkington Library (1)Call number: 621.381548/NOR. Place hold Add to cart (remove)
		Introduction to instrumentation and measurements [electronic resource] / Robert B. Northrop. by Northrop, Robert B [author.] Edition: Third edition. Publisher: Boca Raton : CRC Press, Taylor & Francis Group, [2014] Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		X-ray emission wavelengths and kev tables for nondiffractive analysis [electronic resource] / prepared by G. G. Johnson, Jr., and E. W. White. by Johnson, G. G. (Gerald Glenn), 1939- White, E. W. (Eugene Wilbert) [joint author.] American Society for Testing and Materials Series: ASTM data series ; DS46. Publication details: Philadelphia, Pa. : American Society for Testing and Materials, c1970 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		X-ray emission and absorption wavelengths and two-theta tables [electronic resource] / sponsored by ASTM Committee E-2 on Emission spectroscopy ; prepared by E. W. White, G. G. Johnson, Jr. by White, E. W. (Eugene Wilbert) Johnson, G. G. (Gerald Glenn), 1939- [joint author.] American Society for Testing and Materials ASTM Committee E-2 on Emission Spectroscopy. X-ray emission line wavelength and two-theta tables Series: ASTM data series ; DS37A. Edition: 2nd ed. Publication details: Philadelphia, Pa. : American Society for Testing and Materials, c1970 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)
		Symposium on x-ray and electron probe analysis [electronic resource] : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963. by Symposium on X-ray and Electron Probe Analysis (1963 : Atlantic City, N.J.) ASTM Committee E-2 on Emission Spectroscopy American Society for Testing and Materials. Committee E-4 on Metallography American Society for Testing and Materials. Meeting American Society for Testing and Materials Series: Journal of ASTM International. Selected technical papers ; ; STP 349. Publication details: Philadelphia, Pa. : American Society for Testing and Materials, c1964 Online resources: Click here to access online Availability: Items available for loan: Online Resource (1). Place hold Add to cart (remove)