TY  - BOOK
AU  - Price,Jeffery Ray
AU  - Mériaudeau,Fabrice
ED  - IS & T--the Society for Imaging Science and Technology
ED  - Society of Photo-optical Instrumentation Engineers
TI  - Machine vision applications in industrial inspection XIII: 17-18 January 2005, San Jose, California, USA 
T2  - SPIE proceedings series,
SN  - 0819456527
PY  - 2005///
CY  - Bellingham, Wash., Springfield, Va.
PB  - SPIE, IS&T
KW  - Engineering inspection
KW  - Automation
KW  - Congresses
KW  - Computer vision
KW  - Industrial applications
KW  - Quality control
KW  - Mensuration
N1  - At head of title page "Proceedings of Electronic Imaging, Science and Technology"
ER  -