TY  - GEN
AU  - Bushnell,Michael L.
AU  - Agrawal,Vishwani D.
TI  - Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
T2  - Frontiers in electronic testing
SN  - 0792379918
U1  - 621.395 21
PY  - 2000///
CY  - Boston, Mass., London
PB  - Kluwer Academic
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Digital integrated circuits
KW  - Mixed signal circuits
KW  - Semiconductor storage devices
N1  - Includes bibliographical references and index
ER  -