TY  - GEN
AU  - Malaiya,Yashwant K.
AU  - Rajsuman,Rochit
ED  - IEEE Computer Society.
TI  - Bridging faults and IDDQ testing
T2  - IEEE Computer Society Press technology series
PY  - 1992///
CY  - Los Alamitos, Calif.
PB  - IEEE Computer Society Press
KW  - Metal oxide semiconductors, Complementary
KW  - Testing
KW  - Data processing
N1  - "Sponsored by IEEE CS Technical Committee on Test Technology"; Includes bibliographical references
ER  -