Design for at-speed test, diagnosis and measurement /
Design for at-speed test, diagnosis and measurement /
edited by Benoit Nadeau-Dostie.
- Boston, Mass. ; London : Kluwer Academic, c2000.
- xvii,239p. : ill. ; 26cm.
- Frontiers in electronic testing .
0792386698
Integrated circuits--Testing
Electronic apparatus and appliances--Testing
621.385
0792386698
Integrated circuits--Testing
Electronic apparatus and appliances--Testing
621.385